Texas-instruments Digital Signal Processor SM320F2812-HT Bedienungsanleitung PDF herunterladen (Seite 13)

SM320F2812-HT

www.ti.com

SGUS062B– JUNE 2009– REVISED JUNE 2011

2 Introduction

This section provides a summary of the device features, lists the pin assignments, and describes the

function of each pin. This document also provides detailed descriptions of peripherals, electrical

specifications, parameter measurement information, and mechanical data about the available packaging.

2.1 Description

The SM320F2812 device, member of the C28xE DSP generation, is a highly integrated, high-performance

solution for demanding control applications. The functional blocks and the memory maps are described in

Section 3, Functional Overview.

Throughout this document SM320F2812 is abbreviated as F2812.

2.2 Device Summary

Table 2-1 provides a summary of the device features.

Table 2-1. Hardware Features

FEATURE F2812

Instruction Cycle (at 150 MHz) 6.67 ns

Single-Access RAM (SARAM) (16 bit word) 18K

3.3 V On-Chip Flash (16 bit word) 128K

On-Chip ROM (16-bit word) —

Code Security for On-Chip Flash/SARAM/OTP/ROM Yes

Boot ROM Yes

OTP ROM (1K × 16) Yes

External Memory Interface Yes

Event Managers A and B (EVA and EVB) EVA, EVB

• General-Purpose (GP) Timers 4

• Compare (CMP)/PWM 16

• Capture (CAP)/QEP Channels 6/2

Watchdog Timer Yes

12 Bit ADC Yes

• Channels 16

32 Bit CPU Timers 3

SPI Yes

SCIA, SCIB SCIA, SCIB

CAN Yes

McBSP Yes

Digital I/O Pins (Shared) 56

External Interrupts 3

Supply Voltage 1.8-V Core, (135 MHz) 1.9-V Core

(150 MHz), 3.3-V I/O

Temperature Options S: –55°C to 220°C Yes

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.

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